President Message

   ProbeAce Co., Ltd., founded in 1999, has been researching a unique and novel methodology for realizing a next-generation probe card.

   The semiconductor industry has been eager for a next-generation probe card for more than 10 years. However, a conclusive method has not been realized in spite of an urgent issue. In order to develop the advanced probe card, ProbeAce has proposed a new design method, termed as the AMMECS (Advanced Micro-MechanicalElectricalChemical System).


   Several problems were encountered in developing the next-generation probe card. Simply using down-sizing technology for the probe card could not solve all of the technical and economic problems, such as application to parallel tests on a wafer, higher pin counts with finer pad pitch, and a probe structure that does not require tip cleaning. As another important issue, it was necessary to realize a next-generation dense probe card in a restricted small space, while maintaining the basic electrical characteristics and maintainability of conventional probe cards.

   This new method, “AMMECS,” is a combination of a probe unit architecture called “Gun-Kimo Probe,” which provides a solution of fine-pitch probe arrangements for testing 2.5D/3D ICs with TSV stacking and parallelism of high-end ICs, and “Gun-Kimo Card,” which provides a solution for dense and multi-layered wiring problems.

   Combining breakthroughs in precision probe technology and interconnect technology, as well as wiring technology, our AMMECS probe cards can provide a number of benefits that are unattainable in the conventional probe cards. We are confident that simultaneous solution of probe unit and wiring is the only way to provide the drastic solution for the next generation probe card.

   In addition, drastic design and manufacturing automation is also one of our R&D policies. We have always been researching automated facilities while being associated with the probe architecture. By implementing automatic design and manufacturing processes, ProbeAce has the capability to offer quick turnaround to the market.

   ProbeAce technology will provide total advantages for Cost of Ownership to customers, as well as probe performance.



次世代用プローブカードの必要性は、10年以上前から半導体業界で求められてきましたが、緊急課題であるにもかかわらず決定的な方法論が見出せないままでした。このAdvanced Probe Cardを実現するため、プロブエースは新たな方法論を提唱し、これをAMMECS(Advanced Micro-Mechanical・Electrical・Chemical・System)と命名しました。


この新しい方法論であるAMMECSは、2.5D/3D TSVや高機能ICの検査に適用可能な狭ピッチプローブ配列のソリューションを提供するプローブユニット構造としての”Gun-Kimo Probe”と、高密度・多層配線に対するソリューションを提供する”Gun-Kimo Card”から構成されます。









Profile of President Kimoto

1965  Entered NEC Corporation and engaged in mechanical engineering field; Printers, Automation facilities, Robots etc.

1972  Invented and completed the Japan’s first dot impact Kanji printer, published in the Information Processing Society of Japan (IPSJ) vol.45 No.1 2004.

1999  Established ProbeAce and installed as director. Started development of probe card.

2008  Installed as president of ProbeAce.

2011  Awarded the degree of Doctor (Mechanical engineering) from Chiba University.

Papers (as a first author)

“Contact probe card with large overdrive,” Electro Chemical Society Transactions, vol. 33, pp57-67, 2010.

“A new contact probe without cleaning process,” Transaction of Japan Institute of Electronics Packaging vol. 3, No. 1, 2010.

“New development of contact probe and methodology,” Advanced Materials Research, vol. 126-128, pp 726-731, 2010.

“Design and Manufacture of Novel Probe Card for Testing 3D ICs with TSVs,” IEEE EPTC2012.

“Novel Probe Card with High Count of Needles in Single Sheet for Universal Wafer Testing,” IEEE SWTW2013.